İMAG SERVİS
Apr 30, 2024 | 11 a.m. PDT | 2 p.m. EDT
The elemental analysis of life science samples using scanning electron microscopy (SEM EDS) is inherently challenging because it requires the use of non-destructive and non-invasive techniques. This challenge is particularly pronounced in the EDS analysis of biological materials, which are often beam sensitive and have intricate topographical features. Challenges such as electrical charging and shadowing, which lead to sub-optimal results, are frequently encountered. Additionally, the use of low beam currents to mitigate charging and protect fragile samples can extend measurement times to potentially damaging levels.
The cutting-edge XFlash® FlatQUAD annular detector addresses these analytical challenges. The detector's annular design means it can be strategically positioned between the SEM pole piece and the sample, where it collects X-rays emitted from the sample in all directions thanks to its four seperate detector segments. These design features mean that the XFlash® FlatQUAD provides the largest solid angle available from an EDS detector (1.1 sr), whilst minimizing shadowing effects and enhancing X-ray sensitivity. The high sensitivity of this detector allows for reduced measurement times when examining non-conductive samples without coatings, even at low beam currents and under high-vacuum conditions.
For more details: Bruker.com
