4D STEM WITH TOPSPIN PLATFORM

Using Digistar this system can collect precession electron diffraction (PED) patterns for each point in a scanned image.

Topspin allows researchers to routinely perform advanced analytical experiments inside an Electron Microscope in ways previously not possible.

The Topspin framework enhances TEM capabilities in several key areas:

Synchronized beam scanning and precession with multi-signal data acquisition
Advanced control of DigiSTAR and external optical CCD camera
Virtual STEM imaging with beam precession control. Virtual reference STEM image providing accurate control of scanned region. Mapping of site specific regions possible with precise positioning of region of interest, using multiple scan modes (spot, line, area)
Virtual BF/DF via external optical CCD
On-line distortion correction of CCD camera images
Specific software module that allows data acquisition with high sensitivity/speed from Direct electron detectors. Data can be used with ASTAR or STRAIN.
Drift correction available as a reference image is acquired before scanning. Drift correction window is tracked during acquisition
Calibration of rotation between virtual STEM images and acquired diffraction patterns is automatically exported with ASTAR *.blo files
Full 14-bit dynamic range of acquired diffraction patterns is retained in database files. Intensity scaling (brightness/contrast/gamma) for *.blo files can be readjusted after acquisition

* needs DigiSTAR

AUTOMATED BEAM COMPENSATION

Completely automated simultaneous adjustment of 64 compensation points for best possible spatial resolution. Additional compensation points can be added as needed
16 bit images used for alignment
Sub-pixel alignment accuracy at 580×580 camera resolution performed by looking at the image of the probe in order to provide correct pivot point adjustment, even at large precession angles

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