
e-PDF software suite
ANALYSIS OF AMORPHOUS MATERIALS
e-PDF software suite uses Electron Pair Distribution Function (electron diffraction based technique) that allows to analyze local order in amorphous and nanocrystalline materials from diffuse or ring ED patterns.
Understanding and possible prediction of material physical properties depends upon the knowledge of the local atomic arrangement and crystal structure. Study of nanocrystalline or amorphous materials can be performed with techniques like Pair Distribution Function (PDF) that is used to solve local atomic arrangement by using X-Ray, neutron or electron diffraction (ED) sources. ED related PDF (e-PDF) in Transmission Electron Microscope (TEM) has the advantage over X- Ray PDF technique that allows studying ordering of nanocrystalline materials at very small local scale (nm scale instead of mm ) by collecting (ED) patterns in very short time (ms instead of hours with conventional X-Ray Au or Mo sources). e-PDF has been recently applied to study nanoparticles and amorphous materials and has been established that e-PDF patterns match well equivalent X-Ray PDF patterns. However, local structure information quality based on e-PDF analysis, may be affected by dynamical effects present in ED that affect e-PDF peaks height. In this work we apply e-PDF analysis to study local order on various amorphous and crystalline materials ; in particular we study the influence of Precession Electron Diffraction (PED) to obtain reliable e-PDF local order analysis by lowering dynamical electron diffraction effects.
Understanding and possible prediction of material physical properties depends upon the knowledge of the local atomic arrangement and crystal structure. Study of nanocrystalline or amorphous materials can be performed with techniques like Pair Distribution Function (PDF) that is used to solve local atomic arrangement by using X-Ray, neutron or electron diffraction (ED) sources. ED related PDF (e-PDF) in Transmission Electron Microscope (TEM) has the advantage over X- Ray PDF technique that allows studying ordering of nanocrystalline materials at very small local scale (nm scale instead of mm ) by collecting (ED) patterns in very short time (ms instead of hours with conventional X-Ray Au or Mo sources). e-PDF has been recently applied to study nanoparticles and amorphous materials and has been established that e-PDF patterns match well equivalent X-Ray PDF patterns. However, local structure information quality based on e-PDF analysis, may be affected by dynamical effects present in ED that affect e-PDF peaks height. In this work we apply e-PDF analysis to study local order on various amorphous and crystalline materials ; in particular we study the influence of Precession Electron Diffraction (PED) to obtain reliable e-PDF local order analysis by lowering dynamical electron diffraction effects.
Diğer Ürünler
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QUANTAX EDS for SEM -
QUANTAX WDS -
EBSD -
Micro-XRF -
Fourier 80 -
ELEXSYS -
EMXplus -
EMXmicro -
Magnettech ESR5000 -
AvanceCore -
Avance NMR -
GHz Sınıfı NMR -
ASTAR -
TEM STRAIN MAPPING ANALYSIS -
4D STEM WITH TOPSPIN PLATFORM -
3D PRECESSION DIFFRACTION TOMOGRAPHY – MICRO ED -
4D-Scanning Precession Electron Diffraction (4D-SPED) -
ENHANCED EELS & EDX SPECTROSCOPY -
FireFly -
SyncRay -
3-axes Motorized Stage -
Custom designed systems -
MINISPEC MQ SERIES Contrast Agent Analyzer -
MINISPEC MQ SERIES Toothpaste Analyzer -
MINISPEC MQ SERİSİ Polimer Araştırma Analizörü -
MINISPEC MQ ONE SERİSİ Fiberlerde Daldırma -
MINISPEC MQ ONE SERİSİ Hidrojen Analizörü -
MINISPEC MQ ONE SERİSİ Spin-Finish -
MINISPEC LF Serisi -
MINISPEC MQ SERİSİ SFC Analizörü (Yerinde Güncellenilebilir) -
MINISPEC MQ 20 SERİSİ Toplam Yağ ve Nem -
MINISPEC MQ 20 SERİSİ Droplet Size Analizörü 2.0 -
MINISPEC MQ ONE SERIES Seeds Analyzer -
5'i bir arada -
LUXOR Altın Kaplama -
LUXOR Platin Kaplama -
Aksesuarlar -
SEM Backscattered Electron Detector -
SEM BSE Diode repair & supply -
Centaurus Cathodoluminescence SEM CL, BSE, YAG Detecto -
BF DF HAADF SEM STEM Detector -
HAADF Annular SEM STEM Detector -
AMT sCMOS & CCD TEM Camera Systems -
SEM EBIC Amplifier (Specimen Current Detector) & specimen holders -
Model 1064 ChipMill -
Model 1040 NanoMill® TEM Örneği Hazırlama Sistemi -
Model 1080 PicoMill® TEM Örneği Hazırlama Sistemi -
Model 1061 SEM Mill -
Model 1051 TEM Mill -
Model 1062 TrionMill -
Model 1070 NanoClean -
Model 1020 Plasma Cleaner -
Model 9030 Turbo Pumping Station -
Model 9020 Vacuum Pumping Station -
Model 9010 Vacuum Storage Container -
Model 120 Automatic Power Control -
Model 110 Automatic Twin-Jet Electropolisher -
Model 140 Digital Power Control -
Model 200 Dimpling Grinder -
Model 220 Low Temp Container -
Model 160 Specimen Grinder -
Model 2020 Advanced Tomography Holder -
Model 2021 Analytical Tomography Holder -
Model 2023 Analytical Tomography Holder for Ultra-X -
Model 2552 Cryo Cartridge Specimen Holder -
Model 2550 Cryo Transfer Tomography Holder -
Model 2040Dual-Axis Tomography Holder -
Model 2045 Motorized Dual-Axis Tomography Holder -
Model 2050On-Axis Rotation Tomography Holder -
Model 2030Ultra-Narrow Gap Tomography Holder -
Model 2560Vacuum Transfer Tomography Holder -
1490 series Bulk Liquid Electrochemistry -
1405 series Optical Bulk Liquid Electrochemistry -
Liquid Flow -
Multichannel Gas Environment Heating -
MEMS Heating + Biasing -
Cryo Biasing -
Biasing Manipulator -
Tomography -
Magnetizing -
Liquid Flow -
In-Situ SEM Bulk Liquid Electrochemistry 1470 Series SEM -
SEM Gas + Heating 1300 Series – SEM -
SEM MEMS Heating + Biasing 1590 Series – SEM -
300N & 2kN vertical 3&4 point bending stage for Raman -
200N compression & horizontal bending stage -
Dual leadscrew insitu tensile stage for XRD, Optical & Synchrotron -
2kN & 5kN Tensile compression and horizontal bending stage -
200N compression & horizontal bending stage for SEM -
2kN & 5kN Tensile compression and horizontal bending stage for SEM -
300N & 2kN vertical 3&4 point bending stage for SEM -
NEW EBSD testing stages -
Dual screw tensile stage for XRD, Optical & Synchrotron -
2kN & 5kN Tensile compression and horizontal bending stage -
200N compression & horizontal bending stage -
CT500 500N in-situ tensile stage for µXCT applications -
CT5000 5kN in-situ loadcell tensile stage for X-Ray CT applications -
CT Heating and Cooling cell -20°C to +160°C for µXCT applications -
CT20K, Full Open Frame, Tensile, Compression & Torsion rig, designed for Synchrotron and room based X-ray CT imaging systems -
Biaxial & Quadaxial -
Forensic Comparison Stage for SEM -
miniFly -
Software: ESPRIT Family -
QUANTAX EDS for TEM