Focused ion beam (FIB) milling is a widely used technique for today’s cutting-edge materials that provides a means to prepare transmission electron microscopy (TEM) specimens. The challenge in working with these advanced materials is to create specimens that are electron transparent and are free from artifacts. 

The FIB is highly effective in preparing TEM specimens, but the use of a high-energy, liquid metal ion source can often result in specimen amorphization, gallium implantation, or both. 

The PicoMill system is the ideal complement to FIB technology; it adds the increased capability of producing optimal specimen quality while enhancing the overall specimen preparation throughput by moving final thinning offline.

• Achieve ultimate specimen quality – free from amorphous and implanted layers
• Complements FIB technology
• Milling without introduction of artifacts
• Advanced detector technology
• In situ imaging with ions and electrons
• Microscope connectivity for risk-free specimen handling
• Adds capability and capacity
• Fast, reliable, and easy to use